DFT ID Definition
更新时间： 2026/08/06
在Gitcode上查看源码DFT ID Definition
Change History
| iBMC 4-segment version | Revision Date | Description | Revised By |
|---|---|---|---|
| NA | 2023.12.4 | Added type 6: model customization. The value range is <C1h-FFh>. The DFT IDs of the same model cannot conflict with each other. | Liu Xingsen 00583113 |
| 2023.12.7 | Added C2h for E9000 and TCE management board scenarios. | Zhao Xiang 00448564 | |
| 2024.4.12 | 65 hours are added for the CPU tightening test. | Li Shuolai (employee ID: 30039750) | |
| 2025.11.21 | Added the test scenarios of 45h, 47h, 84h, 85h, C3h and C1h (TianGong). | Deng Shengang 00956133 |
Related commands:
Starting/Stopping a DFT Test: Start DFT Test
Obtaining the Test Result (Get DFT Test Result) Get DFT Test Result
Table 1 DFT Definition
| Type | Category | Component Type | DFT ID | DFT ID | Name | Name | Size | Test Scenario |
|---|---|---|---|---|---|---|---|---|
| 1: yes dft id <1h-40h> | Component<1-20h> | - | 0x01 | 1 | LM75 | LM75 | - | - |
| - | 0x02 | 2 | LM80 | LM80 | - | Multi-channel inspection serial digital interface temperature sensor. Monitors the board power voltage and ambient temperature. The LM80 integrates seven voltage A/D conversion channels and one temperature sensor. | ||
| - | 0x03 | 3 | PCA9555 | PCA9555 | - | 9555 is a function of I2C expansion I/O ports. When the number of I/O ports is insufficient, you can use one I2C channel (only two cables are used) to expand 16 I/O ports. The first four bits are fixed at 0100, A2A1A0 is programmable, and the last bit is the read/write control bit. | ||
| - | 0x04 | 4 | PCA9545 | PCA9545 | - | - | ||
| - | 0x05 | 5 | PCA9517 | PCA9517 | - | - | ||
| - | 0x06 | 6 | INA220 | INA220 | - | - | ||
| - | 0x07 | 7 | Coin battery | Button Cell Voltage | - | - | ||
| - | 0x08 | 8 | Power Supply | Power Supply | - | - | ||
| - | 0x09 | 9 | ME | ME | - | - | ||
| - | 0x0a | 10 | USB flash drive sampling test | SD Card Sample Test | - | - | ||
| - | 0x0b | 11 | FLASH | Flash | - | - | ||
| - | 0x0c | 12 | EEPROM | EEPROM | - | - | ||
| - | 0x0d | 13 | DDR3 | DDR3 | - | - | ||
| - | 0x0e | 14 | SRAM | SRAM | - | - | ||
| - | 0x0f | 15 | CPLD | CPLD | - | - | ||
| - | 0x10 | 16 | CPU Voltage | CPU Voltage | - | - | ||
| - | 0x11 | 17 | Memory voltage | Memory Voltage | - | - | ||
| - | 0x12 | 18 | 12 V voltage | 12V0 Voltage | - | - | ||
| - | 0x13 | 19 | 5 V voltage | 5V0 Voltage | - | - | ||
| - | 0x14 | 20 | 3.3 V voltage | 3V3 Voltage | - | - | ||
| - | 0x15 | 21 | The SD card or USB flash drive is detected. | SD Card Presence | - | Used to directly connect SD cards or USB devices to the BMC. This parameter is discarded. | ||
| - | 0x16 | 22 | TPM card in-position test | TPM Card Presence | - | - | ||
| - | 0x17 | 23 | LM96080 | LM96080 | - | - | ||
| - | 0x18 | 24 | SD card in-position test | SD Card Presence | Used to connect the SD card to the BMC through the RAID control chip. | |||
| - | 0x19 | 25 | SD card random read/write test | - | - | - | ||
| - | 0x1a | 26 | Scans the Hi1710 register. | Hi1710 Test | - | - | ||
| - | 0x1B | 27 | CLK test | CLK Test | Only for 9032 | |||
| - | 0x1C | 28 | Equipment self-check of the network port | - | MM920MM921 | 2023.12.4: This parameter conflicts with the general self-check and is discarded. | ||
| - | 0x1C | 28 | NAND Flash | NAND Flash | - | The self-check is performed on the NAND flash of the BMC. The self-check fails if either of the following conditions is met: (1) The available service life is less than 50%. (2) The number of reserved blocks is less than 70% of the total number of reserved blocks. | ||
Bus<21h-40h> | - | 0x21 | 33 | I2C | I2C | - | - | |
| - | 0x22 | 34 | LPC(KCS/BT) | LPC | - | - | ||
| - | 0x23 | 35 | IPMB | IPMB | - | - | ||
| - | 0x24 | 36 | LocalBus | LocalBus | - | - | ||
| - | 0x25 | 37 | PCIe | PCIe | - | - | ||
| - | 0x26 | 38 | PWM | PWM | - | - | ||
| - | 0x27 | 39 | LAN Switch Test | Lan Switch Test | - | Used by 9032. No record. | ||
| - | 0x28 | 40 | CPLD Self POST | CPLD Self POST | - | Used by 9032. No record. | ||
| - | 0x29 | 41 | PECI | PECI | - | To test the PECI link between the BMC and the x86 CPU, the x86 CPU must be powered on. | ||
| - | 0x2A | 42 | USB port switching test | USB Port Switch | - | The USB port on the panel can be switched between the PCH and the BMC to implement dynamic functions. This test item is used to test whether the channel switching is normal. | ||
| - | 0x2B | 43 | Clock signal self-check | Clock Signal Test | - | Checking Whether Clock Signals Are Normal Based on the CPLD Register Value (Multiple Signals Can Be Detected Simultaneously) | ||
| - | 0x2E | 46 | Inter-Board Heartbeat Loopback Test | Heart Beat Loop Test | - | This command is used to control the inter-board heartbeat loopback test, which is used to perform the inter-board network port loopback test on the equipment backplane. | ||
| - | 0x32 | 50 | General Test of External Hardware Interfaces | External Hardware General Test | - | It is used in the general test scenario where the test is started or stopped through the control hardware interface and the test result is obtained from the hardware interface. For example, a CPLD register is used to control self-check of various components, and a self-check result is also determined by reading a specific CPLD register, for example, a Hisport link. | ||
| 2: Prerequisites are required. dft id <41h-60h>Note: If the type is not 1, some equipment test items are bound to dft IDs (greater than 64). Therefore, each type supports independent numbers ranging from 1 to 64. | - | - | 0x01 | 1 | Switch Network Port Test | - | DA123C | Connect the GE or NCSI network port to the switch through a cable to test whether the network port can correctly receive packets from the switch. DFT parameters: DftId: 0x01 DftType: 0x02 DftParam: NA Manufacture resource information: path: /bmc/kepler/Manufacture/PrepareTest/DftSwitch/:Id interface: bmc.kepler.Manufacture |
| - | 0x41 | 65 | Keyboard | Keyboard | - | The OS needs to be powered on. | ||
| - | 0x42 | 66 | Virtual CD/DVD drive | Virtual CD-ROM | - | The OS needs to be powered on. | ||
| - | 0x43 | 67 | Virtual floppy drive | Virtual Floppy Drive | - | The OS needs to be powered on. | ||
| - | 0x44 | 68 | VCE | VCE | - | The screen image needs to be set. | ||
| - | 0x45 | 69 | JTAG Link | JTAG | - | The peer CPLD needs to be connected. | ||
| - | 0x46 | 70 | SPI (channel from the BMC to the flash memory mounted to the CPLD) | SPI | - | - | ||
| - | 0x47 | 71 | BMC serial port | BMC UART | - | Serial port loopback connector required | ||
| - | 0x48 | 72 | LCD serial port | LCD UART | - | - | ||
| - | 0x49 | 73 | NSCI | NSCI | - | Performing a Loopback Test on the BMC Network Port | ||
| - | 0x4a | 74 | Management interface | Ethernet Port | - | Test scenario: Scenario 1: general-purpose rack: network port loopback test, corresponding to the V2 function dft_net_mgmt_test : general self-loop test of the network port in the rack scenario (TU is sunset. Disadvantage: The network port rate cannot be tested.) , nic_magloop_test%hi170: https://anytestlab.huawei.com/business/tuManage/detail?pageTitle=nic_magloop_test%25hi1710_107 In rack scenarios, network port normalization tests are performed (newly developed TU, network port self-loop tests are incorporated, and network port connectivity and rate tests are performed). nic_ping_test_tobmc_arm TU implementation mechanism: The connectivity and rate test is preferentially performed. If the test fails, the self-loop test is performed. (The network rate can be tested during the handover on June 11, 2024.) https://anytestlab.huawei.com/business/tuManage/detail?tuSolutionId=1000028680 Scenario 2: TCE/TianGong dual-plane test. Test the connectivity of the internal IP address of the chassis to test the two network links between the blade and the management module. BMC V2 reference function: dft_net_base_test TU for testing network ports (TCE/TianGong) in the chassis scenario. base_lswtobmcloop_test%CN90GPUA: https://anytestlab.huawei.com/business/tuManage/detail?pageTitle=base_lswtobmcloop_test%25CN90GPUA_102 | ||
| - | 0x4b | 75 | Memory riser voltage test | Memory Board Voltage | - | - | ||
| - | 0x4d | 77 | BMC clock test | - | - | - | ||
| - | 0x4e | 78 | Jumper cap self-check | Jumper selftest | - | - | ||
| - | 0x4f | 79 | Checking the Link Between the Main Board and the Daughter Board of the Rear Board | FC Link Test | Applicable only to the CX916 and CX220 | Rear Board Features | ||
| - | 0x50 | 80 | Loading the M8PB Firmware | M8PB FW Load | Applicable only to the CX916 and CX220 | Rear Board Features | ||
| - | 0x51 | 81 | LAN Switch Test | Lan Switch Test | - | - | ||
| - | 0x52 | 82 | XCUJ reserved channel test | XCUJ reserved channel | - | - | ||
| - | 0x53 | 83 | Fan | Fan Test | - | param1: number of tested fan speed levels (for example, 40, 50, 80, and 100) param2: stable time of each speed level (20s by default) para3:fanlevel1 para4:fanlevel2 ... paran:fanlevelm | ||
| - | 0x54 | 84 | Hardware Channel Test, | HW Channel Test | Used by BM320 and Kunpeng 920B X6800 ATE Backplane Signal Loopback Test | Example: Scenario 1: IIC Channel and IIC Slave Device Test Scenario 2: Use SMC to read some data and verify the data. Example: test item DftHwChannel_Cpld_Gpio4 The options of Operator are as follows: -- num1 is the actual read data after the AND operation is performed on InputMask configured for CSR. -- num2 is the value of InputValue configured for CSR. local function calculate(num1, num2, operator) local operators={ [1]=function(a, b) return a<b and OK or ERR end, [2]=function(a, b) return a<=b and OK or ERR end, [3]=function(a, b) return a>b and OK or ERR end, [4]=function(a, b) return a>=b and OK or ERR end, [5]=function(a, b) return a==b and OK or ERR end, [6]=function(a, b) return a~=b and OK or ERR end, } return operators[operator](num1, num2) end AtlasT_200_CSR - File (huawei.com) | ||
| - | 0x55 | 85 | NI Loop Test, | NI Loop Test | Only for 9032 | - | ||
| - | 0x56 | 86 | NC serial port loopback test, | NC Serial Loop Test | Only for 9032 | - | ||
| - | 0x57 | 87 | NI eye pattern test, NI EYE test, | Only for 9032 | - | |||
| - | 0x57 | 87 | PHY port loop test, "Loopback in the FT phase: Insert the loopback connector and test the backplane. | - | Used only for E9000 rear boards. | device id indicates the port ID. The value ranges from 0 to 31, indicating 32 ports. The value 0xff indicates all ports. param1: The value 1 indicates the physical self-loop multi-port serial loopback test (used for normal FT tests). Currently, the BMC only configures the mode and does not send packets. The BMC will send packets for subsequent tests. It is recommended that the device ID be set to 0xff. One command is used to start the test and query the result. 2 indicates the logic self-loop multi-port serial loopback test (used for accurate FT locating). Currently, the BMC only configures the mode and does not send packets. The BMC will send packets for testing later. The recommended value of device id ranges from 0 to 31. 3: logic self-loop single-port loopback test (used for ST tests. Currently, the BMC only configures the mode and does not send packets. Later, the BMC sends packets for tests.) It is recommended that you set device id to 0xff. One command is used to start the test and query the result. | ||
| - | 0x58 | 88 | Loopback in the ST phase: No loopback connector is required, and the front board is used. | - | - | Parameters: param1: FruID, one byte param2: TimeOut, detection timeout period, which must be greater than the normal reset time (unit: s), 1 byte (Currently, this command is used for the reset test of the IB chip on the XCUL board.) | ||
| - | 0x59 | 89 | Performs an I/O read test. | - | - | Parameters: param1: value to be written param2: reserved. Set it to 0. | ||
| - | 0x5A | 90 | I/O write test | - | Only for 9032 | Used only for KunLun 9032, cross-BMC/NI interconnection test | ||
| - | 0x5B | 91 | NI interconnection test, NI peer-to-peer test, and NI port interconnection test | - | Used only for the MM921. | Currently, this port is used only for the MM921. The external USB flash drive is used for read and write tests. | ||
| - | 0x5C | 92 | Performs USB read and write tests. | USB RW Test | Used only for the MM921. | Currently, this port is used only for the MM921. The external USB flash drive is used for read and write tests. | ||
| - | 0x5D | 93 | RS485 Half-Duplex Serial Port Test | RS485 Half-duplex Test | Used only for the RM210 | Currently, it is used only for the RM210. The full-duplex test can be performed through the serial port loopback test (71). | ||
| - | 0x5E | 94 | Type-C read/write test | Type-C Test | - | Type-C port read/write test Parameters: param1: 1: Only the USB device is formatted. Other values: The Type-C read/write process is used. | ||
| - | 0x5F | 95 | Detection of the service state of optical modules | Optical Module Test | - | Check whether the optical module port is in position. The device numbers (DevNum) are 0, 1, 2, and 3, which correspond to optical modules SFP0, SFP1, SFP2, and SFP3 respectively. | ||
| - | 0x60 | 96 | Testing the Riser Card Link | - | - | Using the Equipment Tool Card to Test the Standard Riser Card Scenario | ||
| Type | Category | Component Type | DFT ID | DFT ID | Name | Name | Model- | Test Scenario- |
| 3: burn-in test project dft id <61h-80h>Limitations The equipment cannot be directly bound to the DFT ID. The component type and DFT ID must be used to match a unique test item. | - | - | 0x61 | 97 | SD card full-disk test | SD Card Overall Test | - | - |
| - | 0x62 | 98 | Memory VDDQ Voltage Bias Test | VDDQ Volt test | - | Parameters: param1: voltage bias percentage. The value range is [-4, 4]. param2: reserved. Set it to 0. | ||
| - | 0x63 | 99 | I/O VDDN voltage bias test | IO VDDN Test | Taishan | Parameters: param1: voltage bias percentage. The value range is [-5,5]. param2: reserved. Set it to 0. | ||
| - | 0x64 | 100 | CPU core VDDAVS voltage bias test | CPU Core AVS Test | Taishan | Parameters: param1: voltage bias percentage. The value range is [–5, 5]. param2: reserved. Set it to 0. | ||
| CPU:0 | 0x65 | 101 | CPU tightening test | CPU Voltage | - | Parameters: param1: tightened test type 0: FIX, 1: AVS, 2: MBIST param2: voltage bias percentage. If the default bias percentage is used, enter 0xFF. param3: reserved. Set it to 0. | ||
| 0x66 | 102 | CPU tightening test | CPU Voltage | - | - | |||
| 0x67 | 103 | CPU tightening test | CPU Voltage | - | - | |||
| 4: The result needs to be checked manually. dft id <81h-A0h> | - | - | 0x81 | 129 | LED | LED | - | - |
| - | 0x82 | 130 | Nixie tube | Lamp Tube | - | - | ||
| - | 0x83 | 131 | Indicator diagnosis panel | LED Panel | - | - | ||
| - | 0x84 | 132 | LED foolproof | LED Fool-proofing | - | LED indicator foolproof test Parameters: param1: foolproof test mode type, 1 byte. The value range is [0,1]. 0- steady on 1- blinking mode | ||
| - | 0x85 | 133 | Nixie tube foolproof | Digital Tube Fool-proofing | - | Perform a foolproof test on the nixie tube. The nixie tube displays three numbers: param1, param2, and param3. Parameter description: param1: mandatory. The value range is [0,9]. param2: optional. The value range is [0,9]. If this parameter is left blank, the second digit of the nixie tube is displayed as param1. param3: optional. The value range is [0,9]. If this parameter is left blank, the third digit of the nixie tube is displayed as param1. | ||
| 5: Manual operations are required. dft id <A1h-C0h> | - | - | 0xA1 | 161 | Ejector lever | Handle | - | - |
| - | 0xA2 | 162 | UID Button | UID Button | - | - | ||
| - | 0xA3 | 163 | PowerButton | PowerButton | - | - | ||
| - | 0xA4 | 164 | LCD self-check test | LCD Selftest | - | - | ||
| - | 0xA5 | 165 | LCD calibration | LCD Calibrate | - | - | ||
| - | 0xA6 | 166 | Indicators on the LCD | LCD Lamp | - | - | ||
| - | 0xA7 | 167 | LCD backlight indicator | LCD Back Light | - | - | ||
| - | 0xA8 | 168 | Defective pixels on the LCD | LCD Dead Pixel | - | - | ||
| - | 0xA9 | 169 | LCD presence | LCD Presence | - | - | ||
| - | 0xAA | 170 | Button test | Button Test | - | - | ||
| - | 0xAB | 171 | Switch | Switch Test | - | 0: closed; 1: open | ||
| - | 0xAC | 172 | MCU | MCU Test | - | Used for the installation test of the management chip (Micro Control Unit) of the Huawei-developed PCIe card. Device IDs in IPMI commands are defined as follows: 1: internal self-check item of the main control chip 2: peripheral self-check of the main control chip of the PCIe card managed by the MCU 3: Test the button on the panel of the PCIe card managed by the MCU. 4: Test the indicators on the panel of the PCIe card managed by the MCU. 5: MCU log clearing test 6: MCU self-healing function test (triggered by a button) 7: frequency reduction interrupt test triggered by the MCU 8: power-off test of the MCU control chip | ||
| - | 0xAD | 173 | Leakage Detection Card Solenoid Valve Test | Magnetic Valve Test | - | Write the PCA9555 register to open or close the solenoid valve, and then read the other PCA9555 register to check the solenoid valve open or close status. | ||
| - | 0xAE | 174 | Leakage Detection Alarm Test for the Leakage Detection Card | Leak Alarm Test | - | Write data to the PCA9555 register to simulate the generation and clearance of a liquid leakage alarm, and then read another PCA9555 register to check the liquid leakage alarm status. | ||
| - | 0xAF | 175 | NPU overtemperature protection test | Npu High Temp Protect Test | atlas800 | The equipment injects a fault from the inband to trigger the CPLD signal, and then queries the CPLD register from the outband to obtain the overtemperature status. | ||
| 6: model customization dft id <C1h-FFh>Note: The DFT IDs of the same model cannot conflict with each other. | Common | - | 0xC3 | 195 | Chassis cover opening detection and test | Chassis Cover Open Test | - | Used to check the status of the chassis cover during the unpacking test. |
| - | 0xC6 | 198 | SECURITY PANEL TEST | SECURITY PANEL TEST | - | Used for the equipment test of the front bezel test item. | ||
| TianGong | - | 0xC1 | 193 | CAN channel test | - | - | It is used for the CAN channel loopback test. The CAN channel sends test data and reads the corresponding data from the BMC serial port. Equipment test item : https://anytestlab.huawei.com/business/tuManage/detail?pageTitle=can_test_it22smma_101 | |
| TCE | - | 0xC1 | 193 | Computing Board CDR Test | - | TCE computing board | - | |
| Deprecated the following methods: | - | 0xC1 | 193 | SOL serial port | SOL UART | - | - | |
| - | 0xC2 | 194 | Fan | Fan | - | - | ||
| TaiShan | - | 0xC4 | 196 | 60-disk drive drawer pull-out test | 60-disk drawer pull out Test | - | Used to test the pull-out of the TaiShan 5290 60-drive drawer. | |
| Storage | - | 0xC5 | 197 | PENGEA FT TEST | PENGEA FT TEST | Pangea V600R005 | Used for equipment tests of Pangea V600R005 products (Pacific, Arctic, and Atlantic). Device IDs in IPMI commands are defined as follows: 1: fan board indicator test 2: optical module power-on and power-off test | |
| E9000 | - | 0xC2 | 194 | Equipment self-check of the network port on the management board | - | MM920 MM921 TCE management board | - |